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Product Availability: 5 - 7 working days
powerful small sample AFM system
for less than £19,000 (ex VAT).
[switch currency to EUR]
| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| ARROW-NC-10 | 10 pcs |
| € 227.00 £ 197.00 |
|
| ARROW-NC-20 | 20 pcs |
| € 408.00 £ 355.00 |
|
| ARROW-NC-50 | 50 pcs |
| € 903.00 £ 786.00 |
|
| ARROW-NC-W | 385 pcs |
| € 4630.00 £ 4028.00 |
|
Product Availability: 5 - 7 working days
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AFM Probe type:
ARROW-NC
Manufacturer: NanoWorld
(www.nanoworld.com)
Product Description:
Optimized positioning through maximized tip visibility
NanoWorld Arrow™ NC probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability. All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a height of 10 - 15 µm.
Additionally this probe offers a typical tip radius of curvature of less than 10 nm.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
Application Modes:
AFM Probe Specifications:
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Arrow | 0 µm (10 - 15 µm)* | 10 - 15 µm* | 0 µm (0 - 0 µm)* | < 10 nm |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 160 µm (155 - 165 µm)* | 45 µm (40 - 50 µm)* | 4.6 µm (4.1 - 5.1 µm)* | 42 N/m (27 - 80 N/m)* | 285 kHz (240 - 380 kHz)* | ||
* typical range