|Order||Request an official quote (RFQ)|
|Order Code, Price (EUR/GBP)||Probes per set|
|€ 227.00 £ 197.00|
|€ 408.00 £ 355.00|
|€ 903.00 £ 786.00|
|€ 4630.00 £ 4028.00|
Nanosurf NaioAFM System:
Nanosurf Nanite AFM:
Mountable AFM system:
Ideal for R&D and quality control in industry and academia.
A small footprint, affordable system for:
Optimized positioning through maximized tip visibility
NanoWorld Arrow™ NC probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability. All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a height of 10 - 15 µm.
Additionally this probe offers a typical tip radius of curvature of less than 10 nm.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
|cant.||shape||tip height||tip set back||tip radius||full cone angle||half cone angle|
|Arrow||0 µm (10 - 15 µm)*||10 - 15 µm*||0 µm (0 - 0 µm)*||< 10 nm|
|cant.||shape||length||width||thickness||force const.||res. freq.||probe base|
|beam||160 µm (155 - 165 µm)*||45 µm (40 - 50 µm)*||4.6 µm (4.1 - 5.1 µm)*||42 N/m (27 - 80 N/m)*||285 kHz (240 - 380 kHz)*|
* typical range