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Product Availability: 5 - 7 working days
powerful small sample AFM system
for less than £19,000 (ex VAT).
[switch currency to EUR]
| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| ATEC-NC-10 | 10 pcs |
| € 384.00 £ 334.00 |
|
| ATEC-NC-20 | 20 pcs |
| € 686.00 £ 597.00 |
|
| ATEC-NC-50 | 50 pcs |
| € 1513.00 £ 1316.00 |
|
Product Availability: 5 - 7 working days
DANGER: One tiny amount of static electricity while you are handling these
probes will destroy the tip!
We highly recommend that you utilize an ESD
station and if you do not already have one, we have a mobile ESD station
for only £61 (70 EUR).
Considering the costs of these probes, this is a very wise investment.
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AFM Probe type:
ATEC-NC
Manufacturer: NANOSENSORS
(www.nanosensors.com)
Product Description:
NANOSENSORS™ AdvancedTEC™ NC AFM tips are designed for non-contact or tapping mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. This unique feature allows precise positioning and makes the AdvancedTEC™ the only AFM scanning probe in the world that offers REAL TIP VISIBILITY FROM TOP, even when the probe is tilted due to its mounting onto the AFM head. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation).Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.
The probe offers unique features:
- real tip visibility from top
- excellent tip radius of curvature
- monolithic silicon
- highly doped to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
AFM Probe Series:
Application Modes:
AFM Probe Specifications:
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Visible | 0 µm (15 - 20 µm)* | 15 - 20 µm* | 0 µm (0 - 0 µm)* | < 10 nm |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 160 µm (150 - 170 µm)* | 45 µm (40 - 50 µm)* | 4.6 µm (3.6 - 5.6 µm)* | 45 N/m (12 - 110 N/m)* | 335 kHz (210 - 490 kHz)* | ||
* guaranteed range