All-In-One-Al

Product Description:

Versatile silicon AFM probe with 4 different cantilevers on a single AFM holder chip. Rotated, monolithic silicon AFM probe for various applications (Contact Mode, Force Modulation Mode, Tapping Mode and Soft Tapping Mode);
Symmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right cantilever for each application. You dont need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes. BudgetSensors offers consistent high quality at a lower price!

Application Modes:

• Force Modulation AFM Probes (FM)
• Non-Contact / Tapping Mode AFM Probes
• Contact Mode AFM Probes

AFM Probe Specifications:

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
1Tapping Mode	Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm (10 - 20 µm)*	< 10 nm		20°-25° along cantilever axis;  25°-30° from side;  10° at the apex
2Soft Tapping	Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm (10 - 20 µm)*	< 10 nm		20°-25° along cantilever axis;  25°-30° from side;  10° at the apex
3Force Modulation	Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm (10 - 20 µm)*	< 10 nm		20°-25° along cantilever axis;  25°-30° from side;  10° at the apex
4Contact Mode	Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm (10 - 20 µm)*	< 10 nm		20°-25° along cantilever axis;  25°-30° from side;  10° at the apex

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
1Tapping Mode	beam	100 µm (90 - 110 µm)*	50 µm (45 - 55 µm)*	2.7 µm (1.7 - 3.7 µm)*	40 N/m (7 - 160 N/m)*	350 kHz (200 - 500 kHz)*
2Soft Tapping	beam	150 µm (140 - 160 µm)*	30 µm (25 - 35 µm)*	2.7 µm (1.7 - 3.7 µm)*	7.4 N/m (1 - 29 N/m)*	150 kHz (70 - 230 kHz)*
3Force Modulation	beam	210 µm (200 - 220 µm)*	30 µm (25 - 35 µm)*	2.7 µm (1.7 - 3.7 µm)*	2.7 N/m (0.4 - 10 N/m)*	80 kHz (50 - 110 kHz)*
4Contact Mode	beam	500 µm (490 - 510 µm)*	30 µm (25 - 35 µm)*	2.7 µm (1.7 - 3.7 µm)*	0.2 N/m (0.04 - 0.7 N/m)*	15 kHz (10 - 20 kHz)*

* typical range

Coating:

Aluminium reflex coating on detector side of the cantilever, 30 nm thick