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Order Code, Price (EUR/GBP) Probes per set
B50_CONTR-5 5 pcs
€ 1140.00 £ 992.00 add to shopping cart
B50_CONTR-25 25 pcs
€ 5150.00 £ 4481.00 add to shopping cart

Product Availability: 5 - 7 working days


esd kit

DANGER: One tiny amount of static electricity while you are handling these probes will destroy the tip!

We highly recommend that you utilize an ESD station and if you do not already have one, we have a mobile ESD station for only £61 (70 EUR).
Considering the costs of these probes, this is a very wise investment.

Click here to order: ESD Kit

Featured Products

Nanosurf NaioAFM System:

A feature complete, compact but
powerful small sample AFM system
for less than £19,000 (ex VAT).


Nanosurf Nanite AFM:

Ex-demo unit available » »

Mountable AFM system:

  • Motorised Stage
  • Easy Tip Exchange
  • Top/Side Tip View

Ideal for R&D and quality control in industry and academia.


UV/Ozone ProCleaner:

A small footprint, affordable system for:

  • Cleaning AFM Probes
  • Surface Cleaning
  • UV Curing
  • Surface Sterilisation

AFM Probe type:

B50_CONTR

Manufacturer: NanoTools
Product Description:
For applications that require hard contact between tip and sample this SPM probe offers a hemispherical, symmetric and extremely smooth hard tipside coating. This coating, made of EBD diamond like carbon, features extremely high wear resistance. The types B50, B100 and B150 are available from stock - other dimensionswith up to 500 nm radius are available upon request.
The probe offers unique features: - EBD, high density carbon tip
- reliable and precise tip dimensions
- clean, smooth surface; no tip artifacts due to nanoroughness
- hydrophobic surface properties
- SEM certificate for every tip
- high mechanical Q-factor of cantilever for high sensitivity
- tip radius: 50nm +/- 10 %
Application Modes:
AFM Probe Specifications:
AFM Tips:
cant. shape tip height tip set back tip radius full cone angle half cone angle
EBD 0 µm 0 - 0 µm* 0 µm (0 - 0 µm)* < 50 nm

AFM Cantilever(s):
cant. shape length width thickness force const. res. freq. probe base
beam 450 µm (440 - 460 µm)* 50 µm (42.5 - 57.5 µm)* 2 µm (1 - 3 µm)* 0.2 N/m (0.02 - 0.77 N/m)* 13 kHz (6 - 21 kHz)*

* typical range

Coating:
tipside: none backside: Aluminum
Probes Datasheets:
Included.
Windsor Scientific Ltd, 264 Argyll Avenue, Slough Trading Estate, Slough Berkshire, SL1 4HE, United Kingdom
© 2013 - Windsor Scientific | design by ISB