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Product Availability: 5 - 7 working days
powerful small sample AFM system
for less than £19,000 (ex VAT).
[switch currency to EUR]
| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| CNT500_ArrowNCR_3-2 | 2 pcs |
| € 950.00 £ 827.00 |
|
| CNT500_ArrowNCR_3-5 | 5 pcs |
| € 2000.00 £ 1740.00 |
|
| CNT500_ArrowNCR_3-25 | 25 pcs |
| € 9900.00 £ 8613.00 |
|
Product Availability: 5 - 7 working days
DANGER: One tiny amount of static electricity while you are handling these
probes will destroy the tip!
We highly recommend that you utilize an ESD
station and if you do not already have one, we have a mobile ESD station
for only £61 (70 EUR).
Considering the costs of these probes, this is a very wise investment.
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AFM Probe type:
CNT500_ArrowNCR_3
Manufacturer: NanoTools
(www.nanotools.com)
Product Description:
For the nanotools® M*-CNT-500 we pushed our proofen EBD technology to the dimensions of a CNT, maintaining EBD´s key strength. Our M*-CNT-500 is not using a multiwall carbon nanotube attached to a silicon cantilever.
What is critical in nanotube technology is solved for the M*-CNT-500:
• controlled tip length
• controlled tip orientation (angle accuracy better 0.5 deg)
• automated fabrication process
The high aspect ratio part of the probe is made from HIGH-DENSITY, DIAMOND LIKE CARBON( HDC/DLC).
• high aspect ratio
• hydrophobic surface properties
• high stiffness/elastic modulus (8 x of that of silicon)
• low thermal mass
• abrasion resistance
tip spec:
shape: cylindrical
length: 500 nm +/- 100
diameter: 20 nm +/- 5
tilt compensation: 3 deg +/- 0.5
Our HDC dissipates static charge. This leads to probes offering the extreme durability of diamond together with high resolution imaging capability. Applying our patented EBD techninque we ensure a stiff and rigid high aspect ratio probe of superior symmetry and nanometer precision.
Application Modes:
AFM Probe Specifications:
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| EBD | 0.5 µm (0.4 - 0.6 µm)* | 0.4 - 0.6 µm* | 0 (0 - 0 )* | < 5 nm (< 7 nm guaranteed) |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 160 µm (155 - 165 µm)* | 45 µm (40 - 50 µm)* | 4.6 µm (4.1 - 5.1 µm)* | 42 N/m (27 - 80 N/m)* | 285 kHz (240 - 380 kHz)* | ||
* typical range