|Order||Request an official quote (RFQ)|
|Order Code, Price (EUR/GBP)||Probes per set|
|€ 259.00 £ 225.00|
|€ 463.00 £ 403.00|
|€ 1023.00 £ 890.00|
|€ 5252.00 £ 4569.00|
Nanosurf NaioAFM System:
Nanosurf Nanite AFM:
Mountable AFM system:
Ideal for R&D and quality control in industry and academia.
A small footprint, affordable system for:
NanoWorld Pointprobe® CONTSC AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 -15 µm.
Additionally this probes offers typical tip radius of curvature of less than 8 nm.
|cant.||shape||tip height||tip set back||tip radius||full cone angle||half cone angle|
|Standard||0 µm (10 - 15 µm)*||10 - 15 µm*||0 µm (0 - 0 µm)*||< 8 nm|
|cant.||shape||length||width||thickness||force const.||res. freq.||probe base|
|beam||225 µm (220 - 230 µm)*||48 µm (42.5 - 52.5 µm)*||1 µm (0.5 - 1.5 µm)*||0.2 N/m (0.02 - 0.7 N/m)*||23 kHz (10 - 39 kHz)*|
* typical range