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Order Code, Price (EUR/GBP) Probes per set
CP-FM-PM-A-5 5 pcs
€ 396.00 £ 345.00 add to shopping cart
CP-FM-PM-B-5 5 pcs
€ 396.00 £ 345.00 add to shopping cart
CP-FM-PM-C-5 5 pcs
€ 396.00 £ 345.00 add to shopping cart

Product Availability: On demand - 14 days delivery time

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AFM Probe type:

CP-FM-PM

Manufacturer: sQube
Product Description:
The new sQube® colloidal probe combines the well-known features of the proven NANOSENSORS™ FM series such as high application versatility and compatibility with most commercial SPMs with a reproducible sphere radius instead of a sharp tip. The excellent  radius and the minimized variation of diameter provide reproducible signals.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode.

The so called "Colloidal Probe Technique", where single colloids are attached to AFM cantilevers for force measurements, opens the chance for a better understanding of fundamental interactions in a variety of fields.
Examples are adhesion phenomena, particle-surface-interactions, mechanical
properties, suspensions, hydrodynamics and boundary slip - to name just some out of an
increasing number of applications.

 
    The probe offers unique features:

        - sphere material:polymethylmethacrylat (PMMA)

        - excellent sphere diameter A = 1,5 µm, B = 3,36 µm, or C = 6,44µm (all +/- 5%)

          (Due to different masses the resonance frequency can differ.)

          Please choose A, B, or C by ordering!


        - highly doped cantilever to dissipate static charge
        - chemically inert
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
        of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series


This product features alignment grooves on the backside of the holder chip.

Application Modes:
AFM Probe Specifications:
AFM Tips:
cant. shape tip height tip set back tip radius full cone angle half cone angle
Sphere 4 µm (1.9 - 1.675 µm)* 1.9 - 1.675 µm* 0 (0 - 0 )* < 2000 nm (< 3400 nm guaranteed)

AFM Cantilever(s):
cant. shape length width thickness force const. res. freq. probe base
beam 225 µm (215 - 235 µm)* 30 µm (20 - 35 µm)* 3 µm (2 - 4 µm)* 2.8 N/m (0.5 - 9.5 N/m)* 75 kHz (45 - 115 kHz)*

* typical range

Coating:
None
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