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Product Availability: On demand - 14 days delivery time
powerful small sample AFM system
for less than £19,000 (ex VAT).
[switch currency to EUR]
| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| CP-NCH-SiO-A-5 | 5 pcs |
| € 396.00 £ 345.00 |
|
| CP-NCH-SiO-B-5 | 5 pcs |
| € 396.00 £ 345.00 |
|
| CP-NCH-SiO-C-5 | 5 pcs |
| € 396.00 £ 345.00 |
|
Product Availability: On demand - 14 days delivery time
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AFM Probe type:
CP-NCH-SiO
Manufacturer: sQube
(www.sqube.de)
Product Description:
The new sQube® colloidal probe combines the well-known features of the proven NANOSENSORS™ NCH series such as high application versatility and compatibility with most commercial SPMs with a reproducible sphere radius instead of a sharp tip. The excellent radius and the minimized variation of diameter provide reproducible signals.
NCH AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode).
The so called "Colloidal Probe Technique", where single colloids are attached to AFM cantilevers for force measurements, opens the chance for a better understanding of fundamental interactions in a variety of fields.
Examples are adhesion phenomena, particle-surface-interactions, mechanical
properties, suspensions, hydrodynamics and boundary slip - to name just some out of an
increasing number of applications.
The probe offers unique features:
- sphere material: silicon dioxide (SiO2)
- excellent sphere, diameter A = 2 µm, B = 3,5µm, or C = 6,62 µm (all +/- 5%)
(Due to different masses the resonance frequency can differ.)Please choose A, B, or C by ordering!
- highly doped cantilever to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
- precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
of the alignment chip
- compatible with PointProbe® Plus XY-Alignment Series
Application Modes:
AFM Probe Specifications:
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Sphere | 3.5 µm (1.85 - 7 µm)* | 1.85 - 7 µm* | 0 (0 - 0 )* | < 1750 nm (< 3500 nm guaranteed) |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 125 µm (115 - 135 µm)* | 30 µm (22.5 - 37.5 µm)* | 4 µm (3 - 5 µm)* | 42 N/m (10 - 130 N/m)* | 330 kHz (204 - 497 kHz)* | ||
* typical range