ContDLC

Product Description:

Rotated, monolithic silicon AFM probe for contact mode applications; HIGH DURABILITY, HYDROPHOBIC due to Diamond-Like-Carbon coating on tip side of the cantileverSymmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).

Consistent high quality at a lower price!

Application Modes:

• Enhanced Wear Resistance Non-Conductive
• Nanoindentation AFM Probes
• Lithography AFM Probes
• Diamond AFM Probes

AFM Probe Specifications:

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
	Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm (10 - 20 µm)*	< 15 nm

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	beam	450 µm (440 - 460 µm)*	50 µm (45 - 55 µm)*	2 µm (1 - 3 µm)*	0.2 N/m (0.07 - 0.4 N/m)*	13 kHz (9 - 17 kHz)*

* typical range

Coating:

Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick; Aluminum coating on detector side of the cantilever, 30 nm thick