ContGB-G

Product Description:

Rotated, monolithic silicon AFM probe for contact mode and special applications;
Symmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).
- Not recommend for applications with abrasive sample surfaces in Electrical Measurements.
Consistent high quality at a lower price!

Application Modes:

• AFM Probes for Biological Applications
• AFM Probes for Electrical Force / Conductive (EFM, SCM, Tuna, SSR)
• Life Science AFM Probes

AFM Probe Specifications:

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
	Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm (10 - 20 µm)*	< 25 nm		20°-25° along cantilever axis  25°-30° from side  10° at the apex

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	beam	450 µm (440 - 460 µm)*	50 µm (45 - 55 µm)*	2 µm (1 - 3 µm)*	0.2 N/m (0.07 - 0.4 N/m)*	13 kHz (9 - 17 kHz)*

* typical range

Coating:

Overall gold coating, 70 nm thick