your basket is empty
Your order will be processed in GBP.
[switch currency to EUR]
Product Availability: 5 - 7 working days
powerful small sample AFM system
for less than £19,000 (ex VAT).
[switch currency to EUR]
| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| LTESP-10 | 10 pcs |
| € 259.00 £ 225.00 |
|
| LTESP-20 | 20 pcs |
| € 463.00 £ 403.00 |
|
| LTESP-50 | 50 pcs |
| € 1023.00 £ 890.00 |
|
| LTESP-W | 385 pcs |
| € 5252.00 £ 4569.00 |
|
Product Availability: 5 - 7 working days
Featured Products
Nanosurf NaioAFM System:
powerful small sample AFM system
for less than £19,000 (ex VAT).
Nanosurf Nanite AFM:
Mountable AFM system:
- Motorised Stage
- Easy Tip Exchange
- Top/Side Tip View
Ideal for R&D and quality control in industry and academia.
UV/Ozone ProCleaner™:
A small footprint, affordable system for:
- Cleaning AFM Probes
- Surface Cleaning
- UV Curing
- Surface Sterilisation
AFM Probe type:
LTESP
Manufacturer: NanoWorld
(www.nanoworld.com)
Product Description:
Original manufacturer type: NCL.NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping™ mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.Additionally this probe offers excellent tip radius of curvature.
This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Veeco Instruments Inc. is no longer selling this probe which has always been manufactured by NanoWorld®.
Application Modes:
AFM Probe Specifications:
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Standard | 0 µm (10 - 15 µm)* | 10 - 15 µm* | 0 µm (0 - 0 µm)* | < 8 nm (< 12 nm guaranteed) |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 225 µm (220 - 230 µm)* | 38 µm (33 - 43 µm)* | 7 µm (6.5 - 7.5 µm)* | 48 N/m (31 - 71 N/m)* | 190 kHz (160 - 210 kHz)* | ||
* typical range