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Product Availability: 5 - 7 working days
powerful small sample AFM system
for less than £19,000 (ex VAT).
[switch currency to EUR]
| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| MC90-70_ArrowNCR_3-5 | 5 pcs |
| € 2000.00 £ 1740.00 |
|
| MC90-70_ArrowNCR_3-25 | 25 pcs |
| € 9000.00 £ 7830.00 |
|
Product Availability: 5 - 7 working days
DANGER: One tiny amount of static electricity while you are handling these
probes will destroy the tip!
We highly recommend that you utilize an ESD
station and if you do not already have one, we have a mobile ESD station
for only £61 (70 EUR).
Considering the costs of these probes, this is a very wise investment.
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AFM Probe type:
MC90-70_ArrowNCR_3
Manufacturer: NanoTools
(www.nanotools.com)
Product Description:
The nanotools® MC90/70 probes feature a perfectly cylindrical tip shape providing the highest repeatability of depth and bottom width measurements (constant bottom travel distance). The MC90/70 high aspect ratio probes are the AFM in-line metrology solution for 90 nm and 70 nm. They are tilt compensated and are available for most AFM systems.
The high aspect ratio part of the probe is made from HIGH-DENSITY, DIAMOND LIKE CARBON (HDC/DLC).
• high aspect ratio
• hydrophobic surface properties
• high stiffness/elastic modulus (8 x of that of silicon)
• low thermal mass
• abrasion resistance
tip spec:
shape: cylindrical
length: 800 nm +/-200 nm
diameter: 55 nm +/-5 nm
tilt compensation: 3 deg +/- 1 deg
Our HDC dissipates static charge. This leads to probes offering the extreme durability of diamond together with high resolution imaging capability. Applying our patented EBD techninque we ensure a stiff and rigid high aspect ratio probe of superior symmetry and nanometer precision.
Application Modes:
AFM Probe Specifications:
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| High-Aspect-Ratio | 0.8 µm (0.6 - 1 µm)* | 0.6 - 1 µm* | 0 (0 - 0 )* | < 5 nm (< 7 nm guaranteed) |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 160 µm (155 - 165 µm)* | 45 µm (40 - 50 µm)* | 4.6 µm (4.1 - 5.1 µm)* | 42 N/m (27 - 80 N/m)* | 285 kHz (240 - 380 kHz)* | ||
* typical range