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Product Availability: 5 - 7 working days
powerful small sample AFM system
for less than £19,000 (ex VAT).
[switch currency to EUR]
| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| MSS_FMR_13-5 | 5 pcs |
| € 1095.00 £ 953.00 |
|
| MSS_FMR_13-25 | 25 pcs |
| € 4900.00 £ 4263.00 |
|
Product Availability: 5 - 7 working days
DANGER: One tiny amount of static electricity while you are handling these
probes will destroy the tip!
We highly recommend that you utilize an ESD
station and if you do not already have one, we have a mobile ESD station
for only £61 (70 EUR).
Considering the costs of these probes, this is a very wise investment.
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AFM Probe type:
MSS_FMR_13
Manufacturer: NanoTools
(www.nanotools.com)
Product Description:
Metrology Probe MSS SuperSharp PatternedMedia
Tilt compensated. Supersharp, high aspect ratio probe for very fine features such as patterned media. Soft tapping mode cantilever.
Multipurpose high resolution probe with excellent lifetime and reliability. The nanotools® MSS_FMR_13 tip is designed for non-contact, soft tapping/force modulation microscopy. It delivers outstanding resolution in critical AFM applications even on hard, tip eating samples like HDD, ceramics, silicon oxide/nitride, polysilicon to name a few.
The high aspect ratio part of the probe is made from HIGH-DENSITY, DIAMOND LIKE CARBON (HDC/DLC), thus offering the extreme durability of diamond together with high resolution imaging capability. The stiffness/Youngs modulus is 8 x of that of silicon. Applying our patented EBD (electron beam deposition) technique we ensure a stiff and rigid high aspect ratio probe of superior symmetry and nanometer precision.
A 100 % quality check by SEM for every tip, high scan speeds, flexibility in combination with stiffness, 13 deg tilt compensation and optimized cost per scan are key parameters.
- EBD tip on pointprobe FMR/FESPA AFM cantilever
- tilt compensation: 13 deg +/-1 deg
- length of the high aspect ratio spike: 300 nm
- diameter at 300 nm tip length: 30 nm (1:10 aspect ratio)
- tip shape: conical, rotation-symmetric
- excellent tip radius: < 3 nm, typically 2 nm
- 100 % SEM check; good tip guarantee.
- high mechanical Q-factor for high sensitivity.
- fits into automated AFM tools (in fab/in line)
This product features alignment grooves on the backside of the holder chip.
Application Modes:
AFM Probe Specifications:
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| EBD | 0.4 µm (0.3 - 0.5 µm)* | 0.3 - 0.5 µm* | 0 (0 - 0 )* | < 2 (< 5 guaranteed) | < 3° at 300 nm from apex |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 225 µm (215 - 235 µm)* | 28 µm (20 - 35 µm)* | 3 µm (2 - 4 µm)* | 2.8 N/m (0.5 - 9.5 N/m)* | 75 kHz (45 - 115 kHz)* | ||
* typical range