Multi75DLC

Product Description:

Rotated, monolithic silicon AFM probe for force modulation and pulsed force mode (PFM); HIGH DURABILITY, HYDROPHOBIC due to Diamond-Like-Carbon coating on tip side of the cantileverSymmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).

Consistent high quality at a lower price!

Application Modes:

• Enhanced Wear Resistance Non-Conductive
• Nanoindentation AFM Probes
• Lithography AFM Probes
• Diamond AFM Probes

AFM Probe Specifications:

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
	Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm (10 - 20 µm)*	< 15 nm

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	beam	225 µm (215 - 235 µm)*	28 µm (23 - 33 µm)*	3 µm (2 - 4 µm)*	3 N/m (1 - 7 N/m)*	75 kHz (60 - 90 kHz)*

* typical range

Coating:

Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick; Aluminum coating on detector side of the cantilever, 30 nm thick