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Order Code, Price (EUR/GBP) Probes per set
NCLR-10 10 pcs
€ 285.00 £ 248.00 add to shopping cart
NCLR-20 20 pcs
€ 510.00 £ 444.00 add to shopping cart
NCLR-50 50 pcs
€ 1125.00 £ 979.00 add to shopping cart
NCLR-W 385 pcs
€ 5777.00 £ 5026.00 add to shopping cart

Product Availability: 5 - 7 working days

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AFM Probe type:

NCLR

Manufacturer: NanoWorld
Product Description:

NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping™ mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10-15 µm.

Additionally this probe offers typical tip radius of curvature of less than 8 nm.

The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.

Application Modes:
AFM Probe Specifications:
AFM Tips:
cant. shape tip height tip set back tip radius full cone angle half cone angle
Standard 0 µm (10 - 15 µm)* 10 - 15 µm* 0 µm (0 - 0 µm)* < 8 nm (< 12 nm guaranteed)

AFM Cantilever(s):
cant. shape length width thickness force const. res. freq. probe base
beam 225 µm (220 - 230 µm)* 38 µm (33 - 43 µm)* 7 µm (6.5 - 7.5 µm)* 48 N/m (31 - 71 N/m)* 190 kHz (160 - 210 kHz)*

* typical range

Coating:
The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.
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