|Order||Request an official quote (RFQ)|
|Order Code, Price (EUR/GBP)||Probes per set|
|€ 285.00 £ 248.00|
|€ 510.00 £ 444.00|
|€ 1125.00 £ 979.00|
|€ 5777.00 £ 5026.00|
Nanosurf NaioAFM System:
Nanosurf Nanite AFM:
Mountable AFM system:
Ideal for R&D and quality control in industry and academia.
A small footprint, affordable system for:
NanoWorld Pointprobe® NCSTR AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. Thus, tip and sample wear could be significantly decreased.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10-15 µm.
Additionally this probe offers a typical tip radius of curvature of less than 8 nm.
The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.
|cant.||shape||tip height||tip set back||tip radius||full cone angle||half cone angle|
|Standard||12.5 µm (10 - 15 µm)*||10 - 15 µm*||0 µm (0 - 0 µm)*||< 8 nm (< 12 nm guaranteed)|
|cant.||shape||length||width||thickness||force const.||res. freq.||probe base|
|beam||150 µm (145 - 155 µm)*||27 µm (22 - 32 µm)*||2.8 µm (2.3 - 3.3 µm)*||7.4 N/m (3 - 16 N/m)*||160 kHz (120 - 205 kHz)*|
* typical range