your basket is empty
Your order will be processed in GBP.
[switch currency to EUR]
Product Availability: 5 - 7 working days
powerful small sample AFM system
for less than £19,000 (ex VAT).
[switch currency to EUR]
| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| NW-SSS-NCH-10 | 10 pcs |
| € 648.00 £ 564.00 |
|
| NW-SSS-NCH-20 | 20 pcs |
| € 1160.00 £ 1009.00 |
|
| NW-SSS-NCH-50 | 50 pcs |
| € 2558.00 £ 2225.00 |
|
| NW-SSS-NCH-380 | 380 pcs |
| € 12959.00 £ 11274.00 |
|
Product Availability: 5 - 7 working days
DANGER: One tiny amount of static electricity while you are handling these
probes will destroy the tip!
We highly recommend that you utilize an ESD
station and if you do not already have one, we have a mobile ESD station
for only £61 (70 EUR).
Considering the costs of these probes, this is a very wise investment.
Featured Products
Nanosurf NaioAFM System:
powerful small sample AFM system
for less than £19,000 (ex VAT).
Nanosurf Nanite AFM:
Mountable AFM system:
- Motorised Stage
- Easy Tip Exchange
- Top/Side Tip View
Ideal for R&D and quality control in industry and academia.
UV/Ozone ProCleaner™:
A small footprint, affordable system for:
- Cleaning AFM Probes
- Surface Cleaning
- UV Curing
- Surface Sterilisation
AFM Probe type:
NW-SSS-NCH
Manufacturer: NanoWorld
(www.nanoworld.com)
Product Description:
NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 -15 µm.
For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.
This probe offers unique features:
- Typical tip radius of curvature of 2 nm
- Guaranteed tip radius of curvature 5 nm (yield >80%)
- Half cone angle < 10° at the last 200 nm of the tip
Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| 125 µm (120 - 130 µm)* | 30 µm (25 - 35 µm)* | 4 µm (3.5 - 4.5 µm)* | 42 N/m (21 - 78 N/m)* | 320 kHz (250 - 390 kHz)* | |||
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Supersharp | 0 µm (10 - 15 µm)* | 10 - 15 µm* | 0 µm (0 - 0 µm)* | < 2 nm (< 5 nm guaranteed) | < 10° at the last 200 nm of the tip |
* typical range