PPP-FM

Product Description:

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The PPP-FM tip serves also as a basis for magnetic coatings (MFM). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability. 
    The probe offers unique features:
        - excellent tip radius of curvature
        - highly doped to dissipate static charge
        - chemically inert
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
        of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series

Application Modes:

• Force Modulation AFM Probes (FM)

AFM Probe Specifications:

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
	Standard	0 µm	0 - 0 µm*	0 µm (0 - 0 µm)*	< 7 nm (< 10 nm guaranteed)

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	beam	225 µm (215 - 235 µm)*	30 µm (20 - 35 µm)*	3 µm (2 - 4 µm)*	2.8 N/m (0.5 - 9.5 N/m)*	75 kHz (45 - 115 kHz)*

* guaranteed range