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Order Code, Price (EUR/GBP)	Probes per set
SEIHR-10	10 pcs
€ 285.00 £ 248.00
SEIHR-20	20 pcs
€ 510.00 £ 444.00
SEIHR-50	50 pcs
€ 1125.00 £ 979.00
SEIHR-W	385 pcs
€ 5777.00 £ 5026.00

Product Availability: 5 - 7 working days

SEIHR

Manufacturer: NanoWorld (www.nanoworld.com)

Product Description:

NanoWorld Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10-15 µm.

Additionally this probe offers typical tip radius of curvature of less than 8 nm.

The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.

Application Modes:

Non-Contact / Tapping Mode AFM Probes

AFM Probe Specifications:

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
	Standard	0 µm (10 - 15 µm)*	10 - 15 µm*	0 µm (0 - 0 µm)*	< 8 nm (< 12 nm guaranteed)

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	beam	225 µm (220 - 230 µm)*	33 µm (27.5 - 37.5 µm)*	5 µm (4.5 - 5.5 µm)*	15 N/m (9 - 25 N/m)*	130 kHz (110 - 150 kHz)*

* typical range

Coating:

The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.