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Product Availability: 5 - 7 working days
powerful small sample AFM system
for less than £19,000 (ex VAT).
[switch currency to EUR]
| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| TESP-SS-10 | 10 pcs |
| € 648.00 £ 564.00 |
|
| TESP-SS-20 | 20 pcs |
| € 1160.00 £ 1009.00 |
|
| TESP-SS-50 | 50 pcs |
| € 2558.00 £ 2225.00 |
|
| TESP-SS-380 | 380 pcs |
| € 12959.00 £ 11274.00 |
|
Product Availability: 5 - 7 working days
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AFM Probe type:
TESP-SS
Manufacturer: NanoWorld
(www.nanoworld.com)
Product Description:
Original manufacturer type: NW-SSS-NCH.NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.
This probe offers unique features:
- excellent tip radius of curvature
- guaranteed tip radius of curvature 5 nm (yield >80%)
- guaranteed tip radius of curvature 5 nm (yield >80%)
This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Veeco Instruments Inc. is no longer selling this probe which has always been manufactured by NanoWorld®.
Application Modes:
AFM Probe Specifications:
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Supersharp | 10 µm (10 - 15 µm)* | 10 - 15 µm* | 0 (0 - 0 )* | < 2 nm (< 5 nm guaranteed) | < 10° at the last 200 nm of the tip |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 125 µm (120 - 130 µm)* | 30 µm (25 - 35 µm)* | 4 µm (3.5 - 4.5 µm)* | 42 N/m (21 - 78 N/m)* | 320 kHz (250 - 390 kHz)* | ||
* typical range