Tap190DLC

Product Description:

Rotated, monolithic silicon AFM probe for non-contact high frequency applications (intermittent contact, tapping in air); HIGH DURABILITY, HYDROPHOBIC due to Diamond-Like-Carbon coating on tip side of the cantileverSymmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). BudgetSensors Tap190 AFM probes feature a longer cantilever and are meant as an alternative to BudgetSensors Tap300 probes series, when the feedback loop of the AFM system doesnt accept high frequencies (400 kHz) or when the detection system needs a minimum cantilever length > 125 µm. The scanning speed of Tap190 series AFM probes is slightly slower than the scanning speed of the Tap300 series.

Consistent high quality at a lower price!

Application Modes:

• Enhanced Wear Resistance Non-Conductive
• Nanoindentation AFM Probes
• Diamond AFM Probes
• Lithography AFM Probes

AFM Probe Specifications:

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	beam	225 µm (213 - 237 µm)*	38 µm (29 - 47 µm)*	7 µm (6 - 8 µm)*	48 N/m (20 - 100 N/m)*	190 kHz (130 - 250 kHz)*

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
	Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm (10 - 20 µm)*	< 15 nm

* typical range

Coating:

Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick; Aluminum coating on detector side of the cantilever, 30 nm thick