Tap300DLC

Product Description:

Rotated, monolithic silicon AFM probe for non-contact high frequency applications (intermittent contact, tapping in air);

HIGH DURABILITY, HYDROPHOBIC due to Diamond-Like-Carbon coating on tip side of the cantilever

Symmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).

Consistent high quality at a lower price!

Application Modes:

• Enhanced Wear Resistance Non-Conductive
• Nanoindentation AFM Probes
• Diamond AFM Probes
• Lithography AFM Probes

AFM Probe Specifications:

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
	Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm (10 - 20 µm)*	< 15

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	beam	125 µm (115 - 135 µm)*	30 µm (25 - 35 µm)*	4 µm (3 - 5 µm)*	40 N/m (20 - 75 N/m)*	300 kHz (200 - 400 kHz)*

* typical range

Coating:

Diamond-Like-Carbon coating on tip side of the cantilever, 15nm thick; Aluminum coating on detector side of the cantilever, 30 nm thick