Tipless-All-In-One

Product Description:

Tipless AFM probe with 4 different cantilevers on a single AFM holder chip. Monolithic silicon AFM probe for various applications (Contact Mode, Force Modulation Mode, Tapping Mode and Soft Tapping Mode);

The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right cantilever for each application. You dont need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes. BudgetSensors offers consistent high quality at a lower price!

Application Modes:

• Tipless AFM Cantilevers

AFM Probe Specifications:

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
1Tapping Mode	Tipless	0	0 - 0 *	0 (0 - 0 )*
2Soft Tapping	Tipless	0	0 - 0 *	0 (0 - 0 )*
3Force Modulation	Tipless	0	0 - 0 *	0 (0 - 0 )*
4Contact Mode	Tipless	0	0 - 0 *	0 (0 - 0 )*

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
1Tapping Mode	beam	100 µm (90 - 110 µm)*	50 µm (45 - 55 µm)*	2.7 µm (1.7 - 3.7 µm)*	40 N/m (7 - 160 N/m)*	350 kHz (200 - 500 kHz)*
2Soft Tapping	beam	150 µm (140 - 160 µm)*	30 µm (25 - 35 µm)*	2.7 µm (1.7 - 3.7 µm)*	7.4 N/m (1 - 29 N/m)*	150 kHz (70 - 230 kHz)*
3Force Modulation	beam	210 µm (200 - 220 µm)*	30 µm (25 - 35 µm)*	2.7 µm (1.7 - 3.7 µm)*	2.7 N/m (0.4 - 7 N/m)*	80 kHz (50 - 110 kHz)*
4Contact Mode	beam	500 µm (490 - 510 µm)*	30 µm (25 - 35 µm)*	2.7 µm (1.7 - 3.7 µm)*	0.2 N/m (0.4 - 0.07 N/m)*	15 kHz (10 - 20 kHz)*

* typical range