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Product Availability: Available on demand. Please contact us for availability!
powerful small sample AFM system
for less than £19,000 (ex VAT).
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| Order | Request an official quote (RFQ) |
|---|
| Order Code, Price (EUR/GBP) | Probes per set |
|---|---|
| ZEIHR-10 | 10 pcs |
| € 285.00 £ 248.00 |
|
| ZEIHR-20 | 20 pcs |
| € 510.00 £ 444.00 |
|
| ZEIHR-50 | 50 pcs |
| € 1125.00 £ 979.00 |
|
| ZEIHR-W | 385 pcs |
| € 5777.00 £ 5026.00 |
|
Product Availability: Available on demand. Please contact us for availability!
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AFM Probe type:
ZEIHR
Manufacturer: NanoWorld
(www.nanoworld.com)
Product Description:
NanoWorld Pointprobe® ZEIHR probes are designed for owners of the Zeiss Veritekt microscope using the step mode (non-contact mode). Compared to the Pointprobe® non-contact probes of the NCH and NCL type the force constant is reduced and the resonance frequency is lower. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10-15 µm.
Additionally this probe offers typical tip radius of curvature of less than 8 nm.
The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.
Application Modes:
AFM Probe Specifications:
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Standard | 10 µm (10 - 15 µm)* | 10 - 15 µm* | 0 nm (0 - 0 nm)* | < 8 nm (< 12 nm guaranteed) |
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 225 mm (220 - 230 mm)* | 57 µm (52.5 - 62.5 µm)* | 5 µm (4.5 - 5.5 µm)* | 27 N/m (17 - 41 N/m)* | 130 kHz (110 - 150 kHz)* | ||
* typical range