|Order||Request an official quote (RFQ)|
|Order Code, Price (EUR/GBP)||Probes per set|
|€ 285.00 £ 248.00|
|€ 510.00 £ 444.00|
|€ 1125.00 £ 979.00|
|€ 5777.00 £ 5026.00|
Nanosurf NaioAFM System:
Nanosurf Nanite AFM:
Mountable AFM system:
Ideal for R&D and quality control in industry and academia.
A small footprint, affordable system for:
NanoWorld Pointprobe® ZEIHR probes are designed for owners of the Zeiss Veritekt microscope using the step mode (non-contact mode). Compared to the Pointprobe® non-contact probes of the NCH and NCL type the force constant is reduced and the resonance frequency is lower. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10-15 µm.
Additionally this probe offers typical tip radius of curvature of less than 8 nm.
The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.
|cant.||shape||tip height||tip set back||tip radius||full cone angle||half cone angle|
|Standard||10 µm (10 - 15 µm)*||10 - 15 µm*||0 nm (0 - 0 nm)*||< 8 nm (< 12 nm guaranteed)|
|cant.||shape||length||width||thickness||force const.||res. freq.||probe base|
|beam||225 mm (220 - 230 mm)*||57 µm (52.5 - 62.5 µm)*||5 µm (4.5 - 5.5 µm)*||27 N/m (17 - 41 N/m)*||130 kHz (110 - 150 kHz)*|
* typical range