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Order Code, Price (EUR/GBP) Probes per set
qp-CONT-10 10 pcs
€ 339.00 £ 322.00 add to shopping cart
qp-CONT-20 20 pcs
€ 599.00 £ 569.00 add to shopping cart
qp-CONT-50 50 pcs
€ 1329.00 £ 1263.00 add to shopping cart

Product Availability: 5 - 10 working days

esd kit

DANGER: One tiny amount of static electricity while you are handling these probes will destroy the tip!

We highly recommend that you utilize an ESD station and if you do not already have one, we have a mobile ESD station for only £ ( EUR).
Considering the costs of these probes, this is a very wise investment.

Click here to order: ESD Kit

Featured Products

Nanosurf NaioAFM System:

A feature complete, compact but
powerful small sample AFM system
for less than £17,000 (ex VAT).

UV/Ozone ProCleaner :

A small footprint, affordable system for:

  • Cleaning AFM Probes
  • Surface Cleaning
  • UV Curing
  • Surface Sterilisation

AFM Probe type:


Manufacturer: NANOSENSORS
SEM image of a CONT uniqprobe cantilever
(3D view)
Product Description:

The NANOSENSORS uniqprobe combines the well-known features of the other NANOSENSORS AFM probe series such as high application versatility and compatibility with most commercial SPMs with the additional advantage of a strongly reduced dispersion of force constant and resonance frequency.

The unsurpassed uniformity of the mechanical characteristics of the uniqprobe series is particularly important for applications, where a large number of probes with known and near identical force constants or resonance frequencies are needed. The sensors of the uniqprobe series are especially adapted for molecular biology, biophysics and quantitative nano-mechanical studies.

NANOSENORS qp-CONT AFM probes are designed for contact mode AFM imaging in air or liquid environments. The CONT type is optimized for high sensitivity due to a low force constant.

The probe offers unique features:

  • small dispersion of force constant and resonance frequency 
  • typical tip height 7µm 
  • typical tip radius of curvature smaller than 10nm
  • stress free cantilevers with considerably less bending
  • tip and cantilevers are made of a quartz-like material
  • reduced drift for applications in liquid environments
  • tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)
  • chemically inert
Application Modes:
AFM Probe Specifications:
AFM Tips:
shape tip height tip set back tip radius full cone angle half cone angle
Circular symmetric 7 µm (5.5 - 8.5 µm)* 5.5 - 8.5 µm* ( < 10 nm (< 15 nm guaranteed)

AFM Cantilever(s):
cant. shape length width thickness force const. res. freq. probe base
Beam 125 µm (120 - 130 µm)* 35 µm (33 - 37 µm)* 750 nm (720 - 780 nm)* 0.1 N/m (0.08 - 0.15 N/m)* 30 kHz (26 - 34 kHz)*

* guaranteed range

A chromium/gold layer of about 60nm is partially coating the cantilever on the detector side near its free end where the tip is situated. The main advantages of this partial metallic coating are considerably less cantilever bending and reduced drift for SPM measurements in liquid environments.
Probes Datasheets:
Datasheet for all sensors with sets of 10 or 20 sensors.
Datasheet for up to 32 sensors with full wafer.
Windsor Scientific Ltd, 264 Argyll Avenue, Slough Trading Estate, Slough Berkshire, SL1 4HE, United Kingdom
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