Advanced AFM Probes Search

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Select application modes and refine your search by specs or manufacturer:

By name or description:
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most used only

Application Modes:

  • Non-Contact / Tapping Mode AFM Probes
  • Force Modulation (FM) AFM Probes
  • Contact Mode AFM Probes
  • Life Science AFM Probes
  • Ultra High Frequency AFM Probes
  • Conductive AFM Probes
  • Magnetic AFM Probes
  • Supersharp AFM Probes
  • Diamond AFM Probes
  • Hardened / Enhanced Wear Resistance AFM Probes
  • Nanoindentation and Lithography AFM Probes
  • High Aspect Ratio (HAR) AFM Probes
  • ScanAsyst ®** PeakForce Tapping™** AFM Probes
  • Silicon Nitride AFM Probes
  • Lateral Force Mode AFM Probes (LFM)
  • Tipless AFM Cantilevers and Cantilever Arrays
  • Plateau AFM Tips
  • Colloidal AFM Probes
  • Self-Sensing & Self-Actuating AFM Probes
  • Sphere AFM Tips
  • Functionalized / Modified / Chemical AFM Probes
  • Platinum Silicide AFM Probes
  • Scanning Thermal Microscopy AFM Probes
  • Premounted AFM Probes
  • Search by AFM Probes properties:

    Force constant: from: to: N/m *Valid range from: to:
    Resonance Frequency: from: to: kHz *Valid range from: to:

    Cantilever shape:
    Tip shape:

    AFM Probe coating:

    Manufacturer:
      Windsor Scientific Ltd, 264 Argyll Avenue, Slough Trading Estate, Slough Berkshire, SL1 4HE, United Kingdom
      © 2013 - Windsor Scientific | design by ISB